easyXAFS300+ (XAFS and XES)

The instrument supports both XAFS and XES over ~4.5–25 keV using a Rowland-circle geometry with spherically bent crystal analyzers, delivering resolving power (λ/Δλ) of ~4,500–10,000. Dual X-ray tubes (Ag or Mo source) allow optimization by mode; in XAFS the monochromated flux exceeds 3×10⁵ ph s⁻¹ for minute-scale scans, while in XES core-hole generation rates approach ~10¹² s⁻¹ for concentrated samples. Available elements: Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Ge, As, Se, Br, Sr, Y, Zr, Nb, Mo, Tc, Ru, Rh, Pd, Ba, La, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Hf, Ta, W, Re, Os, Ir, Pt, Au, Hg, Tl, Pd, Bi, Po, At.