Facility & Equipment Details
Description
N-SIM (Structured Illumination Microscopy): resolution 100nm, 2x higher resolution than conventional microscopy.
Inverted Nikon Eclipse Ti research microscope with a motorized stage.
100x objective only for N-SIM imaging.
Laser lines: 405nm, 488nm, 561nm, 640nm.
3D capable.
Inverted Nikon Eclipse Ti research microscope with a motorized stage.
100x objective only for N-SIM imaging.
Laser lines: 405nm, 488nm, 561nm, 640nm.
3D capable.
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