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Zeiss Crossbeam 340 focused Ion Beam-Scanning Electron Microscope (FIB-SEM)

    Equipment/facility: Equipment

      Facility & Equipment Details

      Description

      FE-SEM, Schottky Emitter, High Vacuum or Variable pressure mode available
      Multiple detectors available: InLens Duo(SE and BSE), SE2, VPSE
      Capella FIB column with Ga-Liquid metal ion source
      Voltage range:0.02KV-30kV, Probe Current range: 5pA-100nA, 1.9nm@1KV/1.0nm@15KV
      Equipped with Micromanipulator, capable of TEM lamellas specimen preparation
      Equipped Gas Injection System of Platinum precursor
      Equipped with Oxford EDAX and EBSD detectors
      Equipped with Leica cryo system
      Equipped with Atlas5, a powerful integrated software, capable of 3D tomography imaging and nano-patterning process

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