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3-D fracture mechanics analysis of multilayer thin film package

  • Stony Brook University

Research output: Contribution to conferencePaperpeer-review

Abstract

Various features of crack growth and decohesion in single and multilayer thin film packages are investigated using computational procedures and the results are presented in this paper. The major aim of this investigation is to identify and characterize the driving force for fracture, both in terms of its magnitude and deformation mode, which arises in a thin film structure due to thermal expansion mismatch loading. The emphasis is placed on the geometrical models which are close representations of a thin film package. Residual stresses develop within the structure when the package cools form elevated temperature, or during thermal cycling. New energy integrals are formulated to determine the strain energy release rate and stress intensity factor under such thermal loading conditions.

Original languageEnglish
Pages139-147
Number of pages9
StatePublished - 1993
EventProceedings of the 1993 ASME International Electronics Packaging Conference - Binghamton, NY, USA
Duration: Sep 29 1993Oct 2 1993

Conference

ConferenceProceedings of the 1993 ASME International Electronics Packaging Conference
CityBinghamton, NY, USA
Period09/29/9310/2/93

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