Abstract
Various features of crack growth and decohesion in single and multilayer thin film packages are investigated using computational procedures and the results are presented in this paper. The major aim of this investigation is to identify and characterize the driving force for fracture, both in terms of its magnitude and deformation mode, which arises in a thin film structure due to thermal expansion mismatch loading. The emphasis is placed on the geometrical models which are close representations of a thin film package. Residual stresses develop within the structure when the package cools form elevated temperature, or during thermal cycling. New energy integrals are formulated to determine the strain energy release rate and stress intensity factor under such thermal loading conditions.
| Original language | English |
|---|---|
| Pages | 139-147 |
| Number of pages | 9 |
| State | Published - 1993 |
| Event | Proceedings of the 1993 ASME International Electronics Packaging Conference - Binghamton, NY, USA Duration: Sep 29 1993 → Oct 2 1993 |
Conference
| Conference | Proceedings of the 1993 ASME International Electronics Packaging Conference |
|---|---|
| City | Binghamton, NY, USA |
| Period | 09/29/93 → 10/2/93 |
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