A chamber for the in-situ IR measurement of C60 thin films while doping with alkali metals

Daniel Koller; Michael C. Martin; P. W. Stephens; L. Mihaly

doi:10.1063/1.1145100

A chamber for the in-situ IR measurement of C₆₀ thin films while doping with alkali metals

Daniel Koller
, Michael C. Martin
, P. W. Stephens
, L. Mihaly

Physics and Astronomy

Stony Brook University

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

A sample chamber has been designed to simultaneously measure the DC resistivity and IR transmission of C₆₀ thin films while the films are doped with alkali metals in-situ. The chamber construction allows a choice of windows to cover the entire IR and visible range, while x-ray diffraction studies are also possible to determine the sample stoichiometry.

Original language	English
Pages (from-to)	760-761
Number of pages	2
Journal	Review of Scientific Instruments
Volume	65
Issue number	3
DOIs	https://doi.org/10.1063/1.1145100
State	Published - 1994

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10.1063/1.1145100

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title = "A chamber for the in-situ IR measurement of C60 thin films while doping with alkali metals",

abstract = "A sample chamber has been designed to simultaneously measure the DC resistivity and IR transmission of C60 thin films while the films are doped with alkali metals in-situ. The chamber construction allows a choice of windows to cover the entire IR and visible range, while x-ray diffraction studies are also possible to determine the sample stoichiometry.",

author = "Daniel Koller and Martin, \{Michael C.\} and Stephens, \{P. W.\} and L. Mihaly",

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journal = "Review of Scientific Instruments",

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T1 - A chamber for the in-situ IR measurement of C60 thin films while doping with alkali metals

AU - Koller, Daniel

AU - Martin, Michael C.

AU - Stephens, P. W.

AU - Mihaly, L.

PY - 1994

Y1 - 1994

N2 - A sample chamber has been designed to simultaneously measure the DC resistivity and IR transmission of C60 thin films while the films are doped with alkali metals in-situ. The chamber construction allows a choice of windows to cover the entire IR and visible range, while x-ray diffraction studies are also possible to determine the sample stoichiometry.

AB - A sample chamber has been designed to simultaneously measure the DC resistivity and IR transmission of C60 thin films while the films are doped with alkali metals in-situ. The chamber construction allows a choice of windows to cover the entire IR and visible range, while x-ray diffraction studies are also possible to determine the sample stoichiometry.

UR - https://www.scopus.com/pages/publications/6144275544

U2 - 10.1063/1.1145100

DO - 10.1063/1.1145100

M3 - Article

AN - SCOPUS:6144275544

SN - 0034-6748

VL - 65

SP - 760

EP - 761

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 3

ER -

A chamber for the in-situ IR measurement of C₆₀ thin films while doping with alkali metals

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