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A joint spatial and magnification based attention framework for large scale histopathology classification

  • Stony Brook University
  • Université Paris-Saclay

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

19 Scopus citations

Abstract

Deep learning has achieved great success in processing large size medical images such as histopathology slides. However, conventional deep learning methods cannot handle the enormous image sizes; instead, they split the image into patches which are exhaustively processed, usually through multi-instance learning approaches. Moreover and especially in histopathology, determining the most appropriate magnification to generate these patches is also exhaustive: a model needs to traverse all the possible magnifications to select the optimal one. These limitations make the application of deep learning on large medical images and in particular histopathological images markedly inefficient. To tackle these problems, we propose a novel spatial and magnification based attention sampling strategy. First, we use a down-sampled large size image to estimate an attention map that represents a spatial probability distribution of informative patches at different magnifications. Then a small number of patches are cropped from the large size medical image at certain magnifications based on the obtained attention. The final label of the large size image is predicted solely by these patches using an end-to-end training strategy. Our experiments on two different histopathology datasets, the publicly available BACH and a subset of the TCGA-PRAD dataset, demonstrate that the proposed method runs 2.5 times faster with automatic magnification selection in training and at least 1.6 times faster than using all patches in inference as the most of state-of-the-art methods do, without loosing in performance.

Original languageEnglish
Title of host publicationProceedings - 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021
PublisherIEEE Computer Society
Pages3771-3779
Number of pages9
ISBN (Electronic)9781665448994
DOIs
StatePublished - Jun 2021
Event2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021 - Virtual, Online
Duration: Jun 19 2021Jun 25 2021

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021
CityVirtual, Online
Period06/19/2106/25/21

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