Abstract
A general-purpose method that includes nearly all possible two-beam diffraction mechanisms is presented for calculating diffracted and specularly reflected X-ray intensities from single crystals. Based on this method, it is demonstrated that a small universal computational routine can be developed to accurately treat two-beam diffraction for any scattering geometry.
| Original language | English |
|---|---|
| Pages (from-to) | 163-167 |
| Number of pages | 5 |
| Journal | Acta Crystallographica Section A: Foundations of Crystallography |
| Volume | 59 |
| Issue number | 2 |
| DOIs | |
| State | Published - Mar 2003 |
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