TY - GEN
T1 - ALAMO
T2 - Design, Automation and Test in Europe, DATE'06
AU - Zhang, Hui
AU - Zhao, Yang
AU - Doboli, Alex
PY - 2006
Y1 - 2006
N2 - This paper describes an original methodology for accurately modeling MOSFETprocess parameter variations. As compared to other process parameter variation modeling methods, the proposed methodology is capable of correctly modeling not only differences of process/model parameters, but also the process parameter variations for individual devices. This capability is very important for popular analog circuits like current biasing circuits, voltage reference circuits, and single-ended output amplifiers.
AB - This paper describes an original methodology for accurately modeling MOSFETprocess parameter variations. As compared to other process parameter variation modeling methods, the proposed methodology is capable of correctly modeling not only differences of process/model parameters, but also the process parameter variations for individual devices. This capability is very important for popular analog circuits like current biasing circuits, voltage reference circuits, and single-ended output amplifiers.
UR - https://www.scopus.com/pages/publications/34047105312
M3 - Conference contribution
AN - SCOPUS:34047105312
SN - 3981080114
SN - 9783981080117
T3 - Proceedings -Design, Automation and Test in Europe, DATE
BT - Proceedings - Design, Automation and Test in Europe, DATE'06
Y2 - 6 March 2006 through 10 March 2006
ER -