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An intelligent HV control and monitoring system for the PHENIX Hadron Blind Detector at the relativistic heavy ion collider

  • M. Proissl
  • , B. Azmoun
  • , S. Boose
  • , M. Durham
  • , T. Hemmick
  • , A. Milov
  • , S. Polizzo
  • , M. Purschke
  • , C. Woody
  • Stony Brook University
  • Brookhaven National Laboratory
  • Weizmann Institute of Science

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The PHENIX Hadron Blind Detector (HBD) is a high-performance Cherenkov counter used to detect electrons in relativistic heavy ion collisions at RHIC. A High Voltage Control and Monitoring System (HVC) was developed to provide optimal control over the detector for maximal performance and protection against damage from possible discharges. The HVC comprises several novel hardware components including a voltage divider board and trip detection/protection boards for each power supply module, while actual control of the HV is maintained by a software suite which incorporates Modern Optimal Control Theory and Artificial Intelligence concepts. The software suite is made up of several concurrently operating subsystems, which periodically processes measurements fed back from the HV mainframe, the HBD gas pressure (P) and temperature (T) sensors, analyzes the GEM module behavior in reference to its performance over time, determines a custom response and modifies the HV when necessary. Since the HBD gain is very sensitive to P/T fluctuations, the HVC automatically modifies the GEM/Mesh voltage accordingly in order to keep the gain variations within a nominal operating range of / 10%. Both hardware and software components of the HVC will be described, along with the successful performance results throughout the commissioning pp Run-9 and the HBD's final and most important AuAu Run-10.

Original languageEnglish
Title of host publicationIEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010
Pages865-870
Number of pages6
DOIs
StatePublished - 2010
Event2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010 - Knoxville, TN, United States
Duration: Oct 30 2010Nov 6 2010

Publication series

NameIEEE Nuclear Science Symposium Conference Record
ISSN (Print)1095-7863

Conference

Conference2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010
Country/TerritoryUnited States
CityKnoxville, TN
Period10/30/1011/6/10

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