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Changes in the local structure of Ge2Sb2Te5 upon reversible crystallization-amorphization

  • National Institute of Advanced Industrial Science and Technology
  • Photonics Institute
  • JASRI

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The local structure of GST in a real device has been studied by EXAFS the at K-edges of all the constituent elements. Results of concurrent multi-edge analysis are discussed.

Original languageEnglish
Title of host publicationOptical Data Storage, ODS 2003
PublisherOptica Publishing Group (formerly OSA)
Pages223-224
Number of pages2
ISBN (Electronic)1557527326
StatePublished - 2003
EventOptical Data Storage, ODS 2003 - Vancouver, Canada
Duration: May 11 2003May 14 2003

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceOptical Data Storage, ODS 2003
Country/TerritoryCanada
CityVancouver
Period05/11/0305/14/03

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