Characterization and application of a GE amorphous silicon flat panel detector in a synchrotron light source

J. H. Lee; J. Almer; C. Aydner; J. Bernier; K. Chapman; P. Chupas; D. Haeffner; K. Kump; P. L. Lee; U. Lienert; A. Miceli; G. Vera

doi:10.1016/j.nima.2007.08.103

Characterization and application of a GE amorphous silicon flat panel detector in a synchrotron light source

J. H. Lee
, J. Almer
, C. Aydner
, J. Bernier
, K. Chapman
, P. Chupas
, D. Haeffner
, K. Kump
, P. L. Lee
, U. Lienert
, A. Miceli
, G. Vera

Chemistry

United States Department of Energy
Los Alamos National Laboratory
GE Healthcare United States

Research output: Contribution to journal › Article › peer-review

24 Scopus citations

Abstract

Characterization, in the language of synchrotron radiation, was performed on a GE Revolution 41RT flat panel detector using the X-ray light source at the Advanced Photon Source (APS). The detector has an active area of 41×41 cm² with 200×200 μm² pixel size. The nominal working photon energy is around 80 keV. Modulation transfer function (MTF) was measured in terms of line spread function (LSF) using a 25 μm×1 cm tungsten slit. Memory effects of the detector elements, called lag, were also measured. The large area and fast data capturing rate -8 fps in unbinned mode, 30 fps in binned or region of interest (ROI) mode-make the GE flat panel detector a unique and very versatile detector for synchrotron experiments. In particular, we present data from pair distribution function (PDF) measurements to demonstrate the special features of this detector.

Original language	English
Pages (from-to)	182-184
Number of pages	3
Journal	Nuclear Inst. and Methods in Physics Research, A
Volume	582
Issue number	1
DOIs	https://doi.org/10.1016/j.nima.2007.08.103
State	Published - Nov 11 2007

Keywords

Flat panel detector
Pair distribution function
Stress-strain measurement

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10.1016/j.nima.2007.08.103

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Lee, J. H., Almer, J., Aydner, C., Bernier, J., Chapman, K., Chupas, P., Haeffner, D., Kump, K., Lee, P. L., Lienert, U., Miceli, A., & Vera, G. (2007). Characterization and application of a GE amorphous silicon flat panel detector in a synchrotron light source. Nuclear Inst. and Methods in Physics Research, A, 582(1), 182-184. https://doi.org/10.1016/j.nima.2007.08.103

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title = "Characterization and application of a GE amorphous silicon flat panel detector in a synchrotron light source",

abstract = "Characterization, in the language of synchrotron radiation, was performed on a GE Revolution 41RT flat panel detector using the X-ray light source at the Advanced Photon Source (APS). The detector has an active area of 41×41 cm2 with 200×200 μm2 pixel size. The nominal working photon energy is around 80 keV. Modulation transfer function (MTF) was measured in terms of line spread function (LSF) using a 25 μm×1 cm tungsten slit. Memory effects of the detector elements, called lag, were also measured. The large area and fast data capturing rate -8 fps in unbinned mode, 30 fps in binned or region of interest (ROI) mode-make the GE flat panel detector a unique and very versatile detector for synchrotron experiments. In particular, we present data from pair distribution function (PDF) measurements to demonstrate the special features of this detector.",

keywords = "Flat panel detector, Pair distribution function, Stress-strain measurement",

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T1 - Characterization and application of a GE amorphous silicon flat panel detector in a synchrotron light source

AU - Lee, J. H.

AU - Almer, J.

AU - Aydner, C.

AU - Bernier, J.

AU - Chapman, K.

AU - Chupas, P.

AU - Haeffner, D.

AU - Kump, K.

AU - Lee, P. L.

AU - Lienert, U.

AU - Miceli, A.

AU - Vera, G.

PY - 2007/11/11

Y1 - 2007/11/11

N2 - Characterization, in the language of synchrotron radiation, was performed on a GE Revolution 41RT flat panel detector using the X-ray light source at the Advanced Photon Source (APS). The detector has an active area of 41×41 cm2 with 200×200 μm2 pixel size. The nominal working photon energy is around 80 keV. Modulation transfer function (MTF) was measured in terms of line spread function (LSF) using a 25 μm×1 cm tungsten slit. Memory effects of the detector elements, called lag, were also measured. The large area and fast data capturing rate -8 fps in unbinned mode, 30 fps in binned or region of interest (ROI) mode-make the GE flat panel detector a unique and very versatile detector for synchrotron experiments. In particular, we present data from pair distribution function (PDF) measurements to demonstrate the special features of this detector.

AB - Characterization, in the language of synchrotron radiation, was performed on a GE Revolution 41RT flat panel detector using the X-ray light source at the Advanced Photon Source (APS). The detector has an active area of 41×41 cm2 with 200×200 μm2 pixel size. The nominal working photon energy is around 80 keV. Modulation transfer function (MTF) was measured in terms of line spread function (LSF) using a 25 μm×1 cm tungsten slit. Memory effects of the detector elements, called lag, were also measured. The large area and fast data capturing rate -8 fps in unbinned mode, 30 fps in binned or region of interest (ROI) mode-make the GE flat panel detector a unique and very versatile detector for synchrotron experiments. In particular, we present data from pair distribution function (PDF) measurements to demonstrate the special features of this detector.

KW - Flat panel detector

KW - Pair distribution function

KW - Stress-strain measurement

UR - https://www.scopus.com/pages/publications/35348853155

U2 - 10.1016/j.nima.2007.08.103

DO - 10.1016/j.nima.2007.08.103

M3 - Article

AN - SCOPUS:35348853155

SN - 0168-9002

VL - 582

SP - 182

EP - 184

JO - Nuclear Inst. and Methods in Physics Research, A

JF - Nuclear Inst. and Methods in Physics Research, A

IS - 1

ER -

Characterization and application of a GE amorphous silicon flat panel detector in a synchrotron light source

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