Characterizing trace metal impurities in optical waveguide materials using X-ray absorption

P. H. Citrin; P. A. Northrup; R. M. Atkins; P. F. Glodis; L. Niu; M. A. Marcus; D. C. Jacobson

doi:10.1557/proc-524-251

Characterizing trace metal impurities in optical waveguide materials using X-ray absorption

P. H. Citrin
, P. A. Northrup
, R. M. Atkins
, P. F. Glodis
, L. Niu
, M. A. Marcus
, D. C. Jacobson

Geosciences

Lucent Technologies

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Abstract

X-ray absorption measurements are described for identifying metal impurities in silica preforms, the rod-like starting materials from which hair-like optical fibers are drawn. The results demonstrate the effectiveness of this approach as a non-destructive, quantitative, element-selective, position-sensitive, and chemical-state-specific means for characterizing transition metals in the concentration regime of parts per billion.

Original language	English
Pages (from-to)	251-257
Number of pages	7
Journal	Materials Research Society Symposium - Proceedings
Volume	524
DOIs	https://doi.org/10.1557/proc-524-251
State	Published - 1998
Event	Proceedings of the 1998 MRS Spring Meeting - San Francisco, CA, USA Duration: Apr 13 1998 → Apr 17 1998

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10.1557/proc-524-251

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title = "Characterizing trace metal impurities in optical waveguide materials using X-ray absorption",

abstract = "X-ray absorption measurements are described for identifying metal impurities in silica preforms, the rod-like starting materials from which hair-like optical fibers are drawn. The results demonstrate the effectiveness of this approach as a non-destructive, quantitative, element-selective, position-sensitive, and chemical-state-specific means for characterizing transition metals in the concentration regime of parts per billion.",

author = "Citrin, \{P. H.\} and Northrup, \{P. A.\} and Atkins, \{R. M.\} and Glodis, \{P. F.\} and L. Niu and Marcus, \{M. A.\} and Jacobson, \{D. C.\}",

year = "1998",

doi = "10.1557/proc-524-251",

language = "English",

volume = "524",

pages = "251--257",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

note = "Proceedings of the 1998 MRS Spring Meeting ; Conference date: 13-04-1998 Through 17-04-1998",

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TY - JOUR

T1 - Characterizing trace metal impurities in optical waveguide materials using X-ray absorption

AU - Citrin, P. H.

AU - Northrup, P. A.

AU - Atkins, R. M.

AU - Glodis, P. F.

AU - Niu, L.

AU - Marcus, M. A.

AU - Jacobson, D. C.

PY - 1998

Y1 - 1998

N2 - X-ray absorption measurements are described for identifying metal impurities in silica preforms, the rod-like starting materials from which hair-like optical fibers are drawn. The results demonstrate the effectiveness of this approach as a non-destructive, quantitative, element-selective, position-sensitive, and chemical-state-specific means for characterizing transition metals in the concentration regime of parts per billion.

AB - X-ray absorption measurements are described for identifying metal impurities in silica preforms, the rod-like starting materials from which hair-like optical fibers are drawn. The results demonstrate the effectiveness of this approach as a non-destructive, quantitative, element-selective, position-sensitive, and chemical-state-specific means for characterizing transition metals in the concentration regime of parts per billion.

UR - https://www.scopus.com/pages/publications/0031631597

U2 - 10.1557/proc-524-251

DO - 10.1557/proc-524-251

M3 - Conference article

AN - SCOPUS:0031631597

SN - 0272-9172

VL - 524

SP - 251

EP - 257

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Proceedings of the 1998 MRS Spring Meeting

Y2 - 13 April 1998 through 17 April 1998

ER -

Characterizing trace metal impurities in optical waveguide materials using X-ray absorption

Abstract

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