Abstract
Closed-form expressions to estimate power supply noise due to the simultaneous switching of I/O drivers are revisited in this brief. It is shown that existing closed-form expressions share a common limitation and underestimate noise with up to 83% error in advanced nanoscale technologies with fast signal rise/fall times. This characteristic is investigated, both quantitatively and qualitatively. New closed-form expressions are developed for the signals with fast transition times. Results demonstrate that the proposed closed-form expressions exhibit an average error of 3.3% as compared with SPICE simulations, and enhance the accuracy of the existing expressions by up to 79.4%.
| Original language | English |
|---|---|
| Article number | 7516701 |
| Pages (from-to) | 769-773 |
| Number of pages | 5 |
| Journal | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |
| Volume | 25 |
| Issue number | 2 |
| DOIs | |
| State | Published - Feb 2017 |
Keywords
- Integrated circuit interconnections
- integrated circuit modeling
- RLC circuits
- Very large scale integration
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