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Combined in situ X-ray absorption and diffuse reflectance infrared spectroscopy: An attractive tool for catalytic investigations

  • N. S. Marinkovic
  • , Q. Wang
  • , L. Barrio
  • , S. N. Ehrlich
  • , S. Khalid
  • , C. Cooper
  • , A. I. Frenkel
  • University of Delaware
  • Brookhaven National Laboratory
  • Yeshiva University

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

Catalysis investigations are often followed in a range of spectroscopic techniques. While diffuse reflectance infrared Fourier transform spectroscopy (DRIFTS) can be done on a bench-top instrument, X-ray absorption spectroscopy (XAS) techniques, such as extended X-ray absorption fine structure (EXAFS) and X-ray absorption near-edge structure (XANES) require synchrotron light. In order to ensure the same conditions during in situ catalysis for each method, a combined XAS/DRIFTS has been developed at beamline X18A at the National Synchrotron Light Source, Brookhaven National Laboratory. A rapid-scan FTIR spectrometer capable of both mid- and far-infrared measurements is equipped with an arm to redirect the IR beam outside the spectrometer. An in situ reaction chamber, equipped with glassy carbon windows for X-ray light and a KBr window for IR light passage is installed firmly on the arm. The reaction cell can be heated to 600 °C and allows passage of gases through the catalyst so that both XAS and DRIFTS techniques can be done simultaneously in controlled environment conditions. Together with a fast-moving monochromator for quick-EXAFS and mass-spectrometric residual gas analysis, this new tool is a powerful method for testing catalytic reactions in real time.

Original languageEnglish
Pages (from-to)204-206
Number of pages3
JournalNuclear Inst. and Methods in Physics Research, A
Volume649
Issue number1
DOIs
StatePublished - Sep 1 2011

Keywords

  • Combined XAS/DRIFTS
  • Diffuse reflectance infrared
  • Fourier transform spectroscopy
  • Quick-EXAFS
  • X-ray absorption spectroscopy

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