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Computed microtomography studies to characterize microstructure-property correlations in thermal sprayed alumina deposits

  • A. Kulkarni
  • , S. Sampath
  • , A. Goland
  • , H. Herman
  • , B. Dowd
  • Stony Brook University
  • Brookhaven National Laboratory

Research output: Contribution to journalArticlepeer-review

60 Scopus citations

Abstract

X-ray computed microtomography (CMT) is a nondestructive imaging technique that provides cross-sectional view of the interior of an object. CMT allows studies of normally difficult to analyze microstructural features of thermal sprayed coatings. The influence of processing techniques and feedstock characteristics on porosity and its effect on the thermal conductivity and dielectric properties of alumina coatings is reported.

Original languageEnglish
Pages (from-to)471-476
Number of pages6
JournalScripta Materialia
Volume43
Issue number5
DOIs
StatePublished - Aug 14 2000

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