Skip to main navigation Skip to search Skip to main content

Cryogenic semiconductor high-intensity radiation monitors

  • V. G. Palmieri
  • , W. H. Bell
  • , K. Borer
  • , L. Casagrande
  • , C. Da Vià
  • , S. R.H. Devine
  • , B. Dezillie
  • , A. Esposito
  • , V. Granata
  • , F. Hauler
  • , L. Jungermann
  • , Z. Li
  • , C. Lourenço
  • , T. O. Niinikoski
  • , V. O'Shea
  • , G. Ruggiero
  • , P. Sonderegger
  • CERN
  • University of Glasgow
  • University of Bern
  • Laboratório de Instrumentação e Física Experimental de Partículas
  • Brookhaven National Laboratory
  • Technical University of Munich
  • Brunel University London
  • Karlsruhe Institute of Technology

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Abstract

This paper describes a novel technique to monitor high-intensity particle beams by means of a semiconductor detector. It consists of cooling a semiconductor detector down to cryogenic temperature to suppress the thermally generated leakage current and to precisely measure the integrated ionization signal. It will be shown that such a device provides very good linearity and a dynamic range wider than is possible with existing techniques. Moreover, thanks to the Lazarus effect, extreme radiation hardness can be achieved providing in turn absolute intensity measurements against precise calibration of the device at low beam flux.

Original languageEnglish
Pages (from-to)97-100
Number of pages4
JournalNuclear Inst. and Methods in Physics Research, A
Volume510
Issue number1-2
DOIs
StatePublished - Sep 1 2003
EventProceedings of the 2nd International Symposium on Applications (SAMBA 2002) - Trieste, Italy
Duration: May 27 2002May 29 2002

Keywords

  • Cryogenic
  • Detector
  • Lazarus effect
  • Semiconductor

Fingerprint

Dive into the research topics of 'Cryogenic semiconductor high-intensity radiation monitors'. Together they form a unique fingerprint.

Cite this