Current mode imager with nonuniformity correction and edge detection

Nicole Nelson; Soumya Krishnamoorthy; Pamela Abshire

doi:10.1109/MWSCAS.2005.1594120

Current mode imager with nonuniformity correction and edge detection

Nicole Nelson
, Soumya Krishnamoorthy
, Pamela Abshire

Electrical Engineering

University of Maryland, College Park

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

We describe a current mode image plane processor for edge detection with adaptive nonuniformity correction. The correction is implemented at the pixel level using floating gate MOS transistors operating in the sub-threshold region. Edge detection is achieved through the convolution of the pixel array with programmable kernel matrices. Under uniform illumination, nonuniformity correction reduces the number of spurious edges detected, thus improving the quality and dynamic range of the image plane processors. A prototype array of 16×16 pixels with a pixel size of 44.8um by 48.3um and a fill factor of 21.25% has been designed in a commercially available 0.5μm double poly, triple metal CMOS process.

Original language	English
Title of host publication	2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005
Pages	392-395
Number of pages	4
DOIs	https://doi.org/10.1109/MWSCAS.2005.1594120
State	Published - 2005
Event	2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005 - Cincinnati, OH, United States Duration: Aug 7 2005 → Aug 10 2005

Publication series

Name	Midwest Symposium on Circuits and Systems
Volume	2005
ISSN (Print)	1548-3746

Conference

Conference	2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005
Country/Territory	United States
City	Cincinnati, OH
Period	08/7/05 → 08/10/05

Access to Document

10.1109/MWSCAS.2005.1594120

Cite this

@inproceedings{dc982b8701d6449e8570dc680c63b73c,

title = "Current mode imager with nonuniformity correction and edge detection",

abstract = "We describe a current mode image plane processor for edge detection with adaptive nonuniformity correction. The correction is implemented at the pixel level using floating gate MOS transistors operating in the sub-threshold region. Edge detection is achieved through the convolution of the pixel array with programmable kernel matrices. Under uniform illumination, nonuniformity correction reduces the number of spurious edges detected, thus improving the quality and dynamic range of the image plane processors. A prototype array of 16{\texttimes}16 pixels with a pixel size of 44.8um by 48.3um and a fill factor of 21.25\% has been designed in a commercially available 0.5μm double poly, triple metal CMOS process.",

author = "Nicole Nelson and Soumya Krishnamoorthy and Pamela Abshire",

year = "2005",

doi = "10.1109/MWSCAS.2005.1594120",

language = "English",

isbn = "0780391977",

series = "Midwest Symposium on Circuits and Systems",

pages = "392--395",

booktitle = "2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005",

note = "2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005 ; Conference date: 07-08-2005 Through 10-08-2005",

}

Nelson, N, Krishnamoorthy, S & Abshire, P 2005, Current mode imager with nonuniformity correction and edge detection. in 2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005., 1594120, Midwest Symposium on Circuits and Systems, vol. 2005, pp. 392-395, 2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005, Cincinnati, OH, United States, 08/7/05. https://doi.org/10.1109/MWSCAS.2005.1594120

Current mode imager with nonuniformity correction and edge detection. / Nelson, Nicole; Krishnamoorthy, Soumya; Abshire, Pamela.
2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005. 2005. p. 392-395 1594120 (Midwest Symposium on Circuits and Systems; Vol. 2005).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Krishnamoorthy, Soumya

AU - Abshire, Pamela

PY - 2005

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N2 - We describe a current mode image plane processor for edge detection with adaptive nonuniformity correction. The correction is implemented at the pixel level using floating gate MOS transistors operating in the sub-threshold region. Edge detection is achieved through the convolution of the pixel array with programmable kernel matrices. Under uniform illumination, nonuniformity correction reduces the number of spurious edges detected, thus improving the quality and dynamic range of the image plane processors. A prototype array of 16×16 pixels with a pixel size of 44.8um by 48.3um and a fill factor of 21.25% has been designed in a commercially available 0.5μm double poly, triple metal CMOS process.

AB - We describe a current mode image plane processor for edge detection with adaptive nonuniformity correction. The correction is implemented at the pixel level using floating gate MOS transistors operating in the sub-threshold region. Edge detection is achieved through the convolution of the pixel array with programmable kernel matrices. Under uniform illumination, nonuniformity correction reduces the number of spurious edges detected, thus improving the quality and dynamic range of the image plane processors. A prototype array of 16×16 pixels with a pixel size of 44.8um by 48.3um and a fill factor of 21.25% has been designed in a commercially available 0.5μm double poly, triple metal CMOS process.

UR - https://www.scopus.com/pages/publications/33847155130

U2 - 10.1109/MWSCAS.2005.1594120

DO - 10.1109/MWSCAS.2005.1594120

M3 - Conference contribution

AN - SCOPUS:33847155130

SN - 0780391977

SN - 9780780391970

T3 - Midwest Symposium on Circuits and Systems

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BT - 2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005

T2 - 2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005

Y2 - 7 August 2005 through 10 August 2005

ER -

Current mode imager with nonuniformity correction and edge detection

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