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Deep-BCN: Deep networks meet biased competition to create a brain-inspired model of attention control

  • Stony Brook University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

17 Scopus citations

Abstract

The mechanism of attention control is best described by biased-competition theory (BCT), which suggests that a top-down goal state biases a competition among object representations for the selective routing of a visual input for classification. Our work advances this theory by making it computationally explicit as a deep neural network (DNN) model, thereby enabling predictions of goal-directed attention control using real-world stimuli. This model, which we call Deep-BCN, is built on top of an 8-layer DNN pre-trained for object classification, but has layers mapped to early visual (V1, V2/V3, V4), ventral (PIT, AIT), and frontal (PFC) brain areas that have their functional connectivity informed by BCT. Deep-BCN also has a superior colliculus and a frontal-eye field, and can therefore make eye movements. We compared Deep-BCN's eye movements to those made from 15 people performing a categorical search for one of 25 target object categories, and found that it predicted both the number of fixations during search and the saccade-distance travelled before search termination. With Deep-BCN a DNN implementation of BCT now exists, which can be used to predict the neural and behavioral responses of an attention control mechanism as it mediates a goal-directed behavior-in our study the eye movements made in search of a target goal.

Original languageEnglish
Title of host publicationProceedings - 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2018
PublisherIEEE Computer Society
Pages2013-2023
Number of pages11
ISBN (Electronic)9781538661000
DOIs
StatePublished - Dec 13 2018
Event31st Meeting of the IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2018 - Salt Lake City, United States
Duration: Jun 18 2018Jun 22 2018

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume2018-June
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference31st Meeting of the IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2018
Country/TerritoryUnited States
CitySalt Lake City
Period06/18/1806/22/18

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