Abstract
A methodology is developed where a fundamental parameters approach (FPA) description of a laboratory powder diffraction instrument (configured in divergent-beam Bragg-Brentano geometry) is used to determine GSAS-II profile parameters for peak asymmetry and instrumental peak widths. This allows the instrumental contribution to peak shapes to be robustly determined directly from a physical description of the instrument, even though GSAS-II does not directly implement FPA for peak shape computation. The FPA-derived parameters can be used as the starting point for instrument characterization, or to characterize sample broadening without the use of a standard to determine the instrument profile function. This new method can facilitate generation of training sets for machine learning. A plot is generated that shows the differences between the two approaches, demonstrating upper bounds for the accuracy of the GSAS-II profile model for a particular instrumental configuration.
| Original language | English |
|---|---|
| Pages (from-to) | 289-295 |
| Number of pages | 7 |
| Journal | Journal of Applied Crystallography |
| Volume | 55 |
| DOIs | |
| State | Published - Apr 1 2022 |
Keywords
- fundamental parameters
- GSAS-II
- powder diffraction
- Rietveld analysis
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