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Determination of physically based pseudo-Voigt powder diffraction profile terms from the fundamental parameters approach

  • Jonathan J. Denney
  • , Gerard S. Mattei
  • , Marcus H. Mendenhall
  • , James P. Cline
  • , Peter G. Khalifah
  • , Brian H. Toby
  • Stony Brook University
  • Brookhaven National Laboratory
  • National Institute of Standards and Technology
  • Argonne National Laboratory

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

A methodology is developed where a fundamental parameters approach (FPA) description of a laboratory powder diffraction instrument (configured in divergent-beam Bragg-Brentano geometry) is used to determine GSAS-II profile parameters for peak asymmetry and instrumental peak widths. This allows the instrumental contribution to peak shapes to be robustly determined directly from a physical description of the instrument, even though GSAS-II does not directly implement FPA for peak shape computation. The FPA-derived parameters can be used as the starting point for instrument characterization, or to characterize sample broadening without the use of a standard to determine the instrument profile function. This new method can facilitate generation of training sets for machine learning. A plot is generated that shows the differences between the two approaches, demonstrating upper bounds for the accuracy of the GSAS-II profile model for a particular instrumental configuration.

Original languageEnglish
Pages (from-to)289-295
Number of pages7
JournalJournal of Applied Crystallography
Volume55
DOIs
StatePublished - Apr 1 2022

Keywords

  • fundamental parameters
  • GSAS-II
  • powder diffraction
  • Rietveld analysis

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