Abstract
The diameter-dependent Young's modulus, E, and quality factor, Q, of GaN nanowires were measured using electromechanical resonance analysis in a transmission electron microscope. E is close to the theoretical bulk value (∼300 GPa) for a large diameter nanowire (d = 84 nm) but is significantly smaller for smaller diameters. At room temperature, Q is as high as 2800 for d = 84 nm, significantly greater than what is obtained from micromachined Si resonators of comparable surface-to-volume ratio. This implies significant advantages of smooth-surfaced GaN nanowire resonators for nanoelectromechanical system (NEMS) applications. Two closely spaced resonances are observed and attributed to the low-symmetry triangular cross section of the nanowires.
| Original language | English |
|---|---|
| Pages (from-to) | 153-158 |
| Number of pages | 6 |
| Journal | Nano Letters |
| Volume | 6 |
| Issue number | 2 |
| DOIs | |
| State | Published - Feb 2006 |
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