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Diffraction of evanescent waves and nanomechanical displacement detection

  • Devrez M. Karabacak
  • , Kamil L. Ekinci
  • , Choon How Gan
  • , Gregory J. Gbur
  • , M. Selim Ünlü
  • , Stephen B. Ippolito
  • , Bennett B. Goldberg
  • , P. Scott Carney
  • Boston University
  • University of North Carolina at Charlotte
  • IBM

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

Sensitive displacement detection has emerged as a significant technological challenge in mechanical resonators with nanometer-scale dimensions. A novel nanomechanical displacement detection scheme based upon the scattering of focused evanescent fields is proposed. The sensitivity of the proposed approach is studied using diffraction theory of evanescent waves. Diffraction theory results are compared with numerical simulations.

Original languageEnglish
Pages (from-to)1881-1883
Number of pages3
JournalOptics Letters
Volume32
Issue number13
DOIs
StatePublished - Jul 1 2007

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