TY - GEN
T1 - Dominant substrate noise coupling mechanism for multiple switching gates
AU - Salman, Emre
AU - Friedman, Eby G.
AU - Secareanu, Radu M.
AU - Hartin, Olin L.
PY - 2008
Y1 - 2008
N2 - The dominant substrate noise coupling mechanism is determined for multiple switching gates based on a physically intuitive model. The model exhibits reasonable accuracy as compared to SPICE. The regions where ground coupling and source/drain coupling dominate are described based on this model. The impact of multiple parameters such as the rise time, number of switching gates, decoupling capacitance, and parasitic inductance on the dominant noise coupling mechanism is investigated. The dominance of ground coupling in large scale circuits, as generally assumed, is shown to be invalid if sufficient decoupling capacitance is used or the circuit exhibits a low parasitic inductance such as a flip-chip package. The efficacy of several noise reduction techniques is discussed based on the application of the dominant noise analysis model.
AB - The dominant substrate noise coupling mechanism is determined for multiple switching gates based on a physically intuitive model. The model exhibits reasonable accuracy as compared to SPICE. The regions where ground coupling and source/drain coupling dominate are described based on this model. The impact of multiple parameters such as the rise time, number of switching gates, decoupling capacitance, and parasitic inductance on the dominant noise coupling mechanism is investigated. The dominance of ground coupling in large scale circuits, as generally assumed, is shown to be invalid if sufficient decoupling capacitance is used or the circuit exhibits a low parasitic inductance such as a flip-chip package. The efficacy of several noise reduction techniques is discussed based on the application of the dominant noise analysis model.
UR - https://www.scopus.com/pages/publications/49749123061
U2 - 10.1109/ISQED.2008.4479736
DO - 10.1109/ISQED.2008.4479736
M3 - Conference contribution
AN - SCOPUS:49749123061
SN - 0769531172
SN - 9780769531175
T3 - Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008
SP - 261
EP - 266
BT - Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008
T2 - 9th International Symposium on Quality Electronic Design, ISQED 2008
Y2 - 17 March 2008 through 19 March 2008
ER -