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Effect of the lateral carrier leakage on performance of 1.3 μm InGaAsP MQW CMBH lasers

  • L. Shterengas
  • , G. L. Belenky
  • , C. L. Reynolds
  • , M. S. Hybertsen
  • , M. Focht
  • , L. Smith
  • , L. Peticolas
  • , D. Stampone
  • Stony Brook University

Research output: Contribution to conferencePaperpeer-review

Abstract

The effects of lateral leakage current on the performance of 1.3 μm multiple quantum well lasers were discussed. Structures with different mesa widths were grown on one wafer using a specially designed mask. Net modal gain and optical losses were studied using a spatial filtering technique to understand the nature of difference in threshold current densities and external efficiency. The contribution of the lateral leakage to threshold current was also estimated. higher threshold current density was obtained for lasers with narrower mesa width and nonzero lateral leakage. The experimental values of internal efficiency for 1 μm and 100 μm devices were found to be close to unity.

Original languageEnglish
Pages207-208
Number of pages2
StatePublished - 2001
EventConference on Lasers and Electro-Optics (CLEO) - Baltimore, MD, United States
Duration: May 6 2001May 11 2001

Conference

ConferenceConference on Lasers and Electro-Optics (CLEO)
Country/TerritoryUnited States
CityBaltimore, MD
Period05/6/0105/11/01

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