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Effects of carrier concentration and phonon energy on carrier lifetime in Type-2 SLS and properties of InAs1-XSbX alloys

  • Stony Brook University
  • U.S. Army Research Laboratory

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

29 Scopus citations

Abstract

Dependences of carrier lifetime on excess carrier concentration in Type-2 Strained Layer Superlattices (SLS) and bulk HgCdTe were measured at T=77 K. The minor role of Auger recombination in Type-2 SLS materials was confirmed. Acceptor-type centers linked to GaSb were considered to be a channel contributing to carrier recombination in the Type-2 SLS. The difference in optical phonon energy in InAs, GaSb and HgCdTe was discussed in relation to the carrier capture cross-section to the centers and carrier recombination. Gallium-free materials, namely, unrelaxed InAs1-xSbx epilayers with lattice constants up to 2.1 % larger than that of GaSb were developed on GaInSb and AlGaInSb compositionally graded buffer layers grown on GaSb by molecular beam epitaxy (MBE). Alternatively, the InAs 0.12Sb0.88 layer was developed on the InAsSb graded buffer layer grown on InSb. The structural and optical characterization of InAs 1-xSbx layers with the thicknesses in the range from 0.5 to 1.5-μm was performed. Carrier lifetimes in InAs0.8Sb 0.2 longer than that in the Type-2 SLS have been demonstrated.

Original languageEnglish
Title of host publicationInfrared Technology and Applications XXXVII
DOIs
StatePublished - 2011
EventInfrared Technology and Applications XXXVII - Orlando, FL, United States
Duration: Apr 25 2011Apr 29 2011

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8012
ISSN (Print)0277-786X

Conference

ConferenceInfrared Technology and Applications XXXVII
Country/TerritoryUnited States
CityOrlando, FL
Period04/25/1104/29/11

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