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Effects of dislocations and sub-grain boundaries on X-ray response maps of CdZnTe radiation detectors

  • A. Hossain
  • , A. E. Bolotnikov
  • , G. S. Camarda
  • , Y. Cui
  • , R. Gul
  • , K. Kim
  • , B. Raghothamachar
  • , G. Yang
  • , R. B. James
  • Brookhaven National Laboratory

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

The imperfect quality of CdZnTe (CZT) crystals for radiation detectors seriously diminishes their suitability for different applications. Dislocations and other dislocation-related defects, such as sub-grain boundaries and dislocation fields around Te inclusions, engender significant charge losses and, consequently, cause fluctuations in the detector's output signals, thereby hindering their spectroscopic responses. In this paper, we discuss our results from characterizing CZT material by using a high-spatial-resolution X-ray response mapping system at BNL's National Synchrotron Light Source. In this paper, we emphasize the roles of these dislocation-related defects and their contributions in degrading the detector's performance. Specifically, we compare the effects of the sub-grain- and coherent twin-boundaries on the X-ray response maps.

Original languageEnglish
Title of host publicationNuclear Radiation Detection Materials - 2011
Pages61-65
Number of pages5
DOIs
StatePublished - 2012
Event2011 MRS Spring Meeting - San Francisco, CA, United States
Duration: Apr 25 2011Apr 29 2011

Publication series

NameMaterials Research Society Symposium Proceedings
Volume1341
ISSN (Print)0272-9172

Conference

Conference2011 MRS Spring Meeting
Country/TerritoryUnited States
CitySan Francisco, CA
Period04/25/1104/29/11

Keywords

  • CdZnTe
  • Crystal defects
  • Dislocations
  • Radiation detectors

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