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Electroreflectance of indium gallium arsenide phosphide lattice matched to indium phosphide

  • Massachusetts Institute of Technology

Research output: Contribution to journalArticlepeer-review

83 Scopus citations

Abstract

We report the first systematic measurement of the electroreflectance spectra of InuGa1-uPvAs1-v over the range of compositions that lattice-match InP substrates, at room temperature and for energies between 0.7 and 3.5 eV. Analysis of the spectra has enabled us to determine the composition dependence of E0, E00, E1, E11, Δ0, and Δ1. Experimentally determined values of E0, E00, and m*/m0 have been used to predict the values of the g factors for these compounds.

Original languageEnglish
Pages (from-to)978-980
Number of pages3
JournalApplied Physics Letters
Volume36
Issue number12
DOIs
StatePublished - 1980

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