Erratum: A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images (Journal of Applied Physics (2014) 116 (104905))

Fangzhen Wu; Huanhuan Wang; Balaji Raghothamachar; Michael Dudley; Stephan G. Mueller; Gil Chung; Edward K. Sanchez; Darren Hansen; Mark J. Loboda; Lihua Zhang; Dong Su; Kim Kisslinger; Eric Stach

doi:10.1063/1.4899320

Erratum: A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images (Journal of Applied Physics (2014) 116 (104905))

Fangzhen Wu
, Huanhuan Wang
, Balaji Raghothamachar
, Michael Dudley
, Stephan G. Mueller
, Gil Chung
, Edward K. Sanchez
, Darren Hansen
, Mark J. Loboda
, Lihua Zhang
, Dong Su
, Kim Kisslinger
, Eric Stach

Materials Science and Engineering

Stony Brook University
Dow Chemical
Brookhaven National Laboratory

Research output: Contribution to journal › Comment/debate

Original language	English
Article number	169901
Journal	Journal of Applied Physics
Volume	116
Issue number	16
DOIs	https://doi.org/10.1063/1.4899320
State	Published - Oct 28 2014

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10.1063/1.4899320

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Wu, F., Wang, H., Raghothamachar, B., Dudley, M., Mueller, S. G., Chung, G., Sanchez, E. K., Hansen, D., Loboda, M. J., Zhang, L., Su, D., Kisslinger, K., & Stach, E. (2014). Erratum: A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images (Journal of Applied Physics (2014) 116 (104905)). Journal of Applied Physics, 116(16), Article 169901. https://doi.org/10.1063/1.4899320

@article{c3cd197b449e4f8fa5a020389b493b47,

title = "Erratum: A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images (Journal of Applied Physics (2014) 116 (104905))",

author = "Fangzhen Wu and Huanhuan Wang and Balaji Raghothamachar and Michael Dudley and Mueller, \{Stephan G.\} and Gil Chung and Sanchez, \{Edward K.\} and Darren Hansen and Loboda, \{Mark J.\} and Lihua Zhang and Dong Su and Kim Kisslinger and Eric Stach",

year = "2014",

month = oct,

day = "28",

doi = "10.1063/1.4899320",

language = "English",

volume = "116",

journal = "Journal of Applied Physics",

issn = "0021-8979",

number = "16",

}

Wu, F, Wang, H, Raghothamachar, B , Dudley, M, Mueller, SG, Chung, G, Sanchez, EK, Hansen, D, Loboda, MJ, Zhang, L, Su, D, Kisslinger, K & Stach, E 2014, 'Erratum: A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images (Journal of Applied Physics (2014) 116 (104905))', Journal of Applied Physics, vol. 116, no. 16, 169901. https://doi.org/10.1063/1.4899320

Erratum: A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images (Journal of Applied Physics (2014) 116 (104905)). / Wu, Fangzhen; Wang, Huanhuan; Raghothamachar, Balaji et al.
In: Journal of Applied Physics, Vol. 116, No. 16, 169901, 28.10.2014.

Research output: Contribution to journal › Comment/debate

TY - JOUR

T1 - Erratum

T2 - A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images (Journal of Applied Physics (2014) 116 (104905))

AU - Wu, Fangzhen

AU - Wang, Huanhuan

AU - Raghothamachar, Balaji

AU - Dudley, Michael

AU - Mueller, Stephan G.

AU - Chung, Gil

AU - Sanchez, Edward K.

AU - Hansen, Darren

AU - Loboda, Mark J.

AU - Zhang, Lihua

AU - Su, Dong

AU - Kisslinger, Kim

AU - Stach, Eric

PY - 2014/10/28

Y1 - 2014/10/28

UR - https://www.scopus.com/pages/publications/84908231764

U2 - 10.1063/1.4899320

DO - 10.1063/1.4899320

M3 - Comment/debate

AN - SCOPUS:84908231764

SN - 0021-8979

VL - 116

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 16

M1 - 169901

ER -

Erratum: A method to determine fault vectors in 4H-SiC from stacking sequences observed on high resolution transmission electron microscopy images (Journal of Applied Physics (2014) 116 (104905))

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