Evidence for Capillary Waves on Dewetted Polymer Film Surfaces: A Combined X-ray and Atomic Force Microscopy Study

M. Tolan; O. H. Seeck; J. P. Schlomka; W. Press; J. Wang; S. K. Sinha; Z. Li; M. H. Rafailovich; J. Sokolov

doi:10.1103/PhysRevLett.81.2731

Evidence for Capillary Waves on Dewetted Polymer Film Surfaces: A Combined X-ray and Atomic Force Microscopy Study

M. Tolan
, O. H. Seeck
, J. P. Schlomka
, W. Press
, J. Wang
, S. K. Sinha
, Z. Li
, M. H. Rafailovich
, J. Sokolov

Materials Science and Engineering

Kiel University
Argonne National Laboratory
Stony Brook University

Research output: Contribution to journal › Article › peer-review

53 Scopus citations

Abstract

Surfaces of thin dewetted polyethylene-propylene films were investigated by atomic force microscopy (AFM) and x-ray scattering. The AFM images show the mesoscopic island structure but do not give information about the microscopic roughness of the polymer surface. Together with the AFM data we were able to identify capillary waves on the island surfaces by their specific power laws in the diffuse x-ray scattering signal. The wave number spectrum of these waves is modified by a cutoff introduced by the van der Waals substrate-film interactions.

Original language	English
Pages (from-to)	2731-2734
Number of pages	4
Journal	Physical Review Letters
Volume	81
Issue number	13
DOIs	https://doi.org/10.1103/PhysRevLett.81.2731
State	Published - Sep 28 1998

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10.1103/PhysRevLett.81.2731

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title = "Evidence for Capillary Waves on Dewetted Polymer Film Surfaces: A Combined X-ray and Atomic Force Microscopy Study",

abstract = "Surfaces of thin dewetted polyethylene-propylene films were investigated by atomic force microscopy (AFM) and x-ray scattering. The AFM images show the mesoscopic island structure but do not give information about the microscopic roughness of the polymer surface. Together with the AFM data we were able to identify capillary waves on the island surfaces by their specific power laws in the diffuse x-ray scattering signal. The wave number spectrum of these waves is modified by a cutoff introduced by the van der Waals substrate-film interactions.",

author = "M. Tolan and Seeck, \{O. H.\} and Schlomka, \{J. P.\} and W. Press and J. Wang and Sinha, \{S. K.\} and Z. Li and Rafailovich, \{M. H.\} and J. Sokolov",

year = "1998",

month = sep,

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doi = "10.1103/PhysRevLett.81.2731",

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T1 - Evidence for Capillary Waves on Dewetted Polymer Film Surfaces

T2 - A Combined X-ray and Atomic Force Microscopy Study

AU - Tolan, M.

AU - Seeck, O. H.

AU - Schlomka, J. P.

AU - Press, W.

AU - Wang, J.

AU - Sinha, S. K.

AU - Li, Z.

AU - Rafailovich, M. H.

AU - Sokolov, J.

PY - 1998/9/28

Y1 - 1998/9/28

N2 - Surfaces of thin dewetted polyethylene-propylene films were investigated by atomic force microscopy (AFM) and x-ray scattering. The AFM images show the mesoscopic island structure but do not give information about the microscopic roughness of the polymer surface. Together with the AFM data we were able to identify capillary waves on the island surfaces by their specific power laws in the diffuse x-ray scattering signal. The wave number spectrum of these waves is modified by a cutoff introduced by the van der Waals substrate-film interactions.

AB - Surfaces of thin dewetted polyethylene-propylene films were investigated by atomic force microscopy (AFM) and x-ray scattering. The AFM images show the mesoscopic island structure but do not give information about the microscopic roughness of the polymer surface. Together with the AFM data we were able to identify capillary waves on the island surfaces by their specific power laws in the diffuse x-ray scattering signal. The wave number spectrum of these waves is modified by a cutoff introduced by the van der Waals substrate-film interactions.

UR - https://www.scopus.com/pages/publications/11544305948

U2 - 10.1103/PhysRevLett.81.2731

DO - 10.1103/PhysRevLett.81.2731

M3 - Article

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SN - 0031-9007

VL - 81

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EP - 2734

JO - Physical Review Letters

JF - Physical Review Letters

IS - 13

ER -

Evidence for Capillary Waves on Dewetted Polymer Film Surfaces: A Combined X-ray and Atomic Force Microscopy Study

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