Abstract
Cr6+, formed as CrO3 along with Cr2O3 during the oxidation of pure chromium, is shown to reduce to Cr4+ (as CrO2) in the course of X-ray photoelectron spectroscopy analysis. Chromate which formed as a result of surface hydration of the oxide film was less affected by irradiation. Estimates have been made of the amounts of CrO3 and CrO4 2- present in the oxide film prior to irradiation.
| Original language | English |
|---|---|
| Pages (from-to) | L5 |
| Journal | Materials science and engineering |
| Volume | 103 |
| Issue number | 2 |
| DOIs | |
| State | Published - Sep 1988 |
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