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Examining nanoscale photovoltaics with high brightness fourier transform measurements

  • Matthew Y. Sfeir
  • , Fernando E. Camino
  • , Chang Yong Nam
  • , Charles T. Black
  • Brookhaven National Laboratory

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We describe a new Facility effort utilizing high brightness Fourier transform methods, including measurements of transmission, reflection, and photoconductivity spectra, to characterize nanomaterial-based model photovoltaic devices.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationQELS_Fundamental Science, CLEO:QELS FS 2013
PagesQTu2O.4
StatePublished - 2013
EventCLEO: QELS_Fundamental Science, CLEO:QELS FS 2013 - San Jose, CA, United States
Duration: Jun 9 2013Jun 14 2013

Publication series

NameCLEO: QELS_Fundamental Science, CLEO:QELS FS 2013

Conference

ConferenceCLEO: QELS_Fundamental Science, CLEO:QELS FS 2013
Country/TerritoryUnited States
CitySan Jose, CA
Period06/9/1306/14/13

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