Skip to main navigation Skip to search Skip to main content

Examining nanoscale photovoltaics with high brightness Fourier transform measurements

  • Matthew Y. Sfeir
  • , Fernando E. Camino
  • , Chang Yong Nam
  • , Charles T. Black
  • Brookhaven National Laboratory

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We describe a new Facility effort utilizing high brightness Fourier transform methods, including measurements of transmission, reflection, and photoconductivity spectra, to characterize nanomaterial-based model photovoltaic devices.

Original languageEnglish
Title of host publication2013 Conference on Lasers and Electro-Optics, CLEO 2013
PublisherIEEE Computer Society
ISBN (Print)9781557529725
DOIs
StatePublished - 2013
Event2013 Conference on Lasers and Electro-Optics, CLEO 2013 - San Jose, CA, United States
Duration: Jun 9 2013Jun 14 2013

Publication series

Name2013 Conference on Lasers and Electro-Optics, CLEO 2013

Conference

Conference2013 Conference on Lasers and Electro-Optics, CLEO 2013
Country/TerritoryUnited States
CitySan Jose, CA
Period06/9/1306/14/13

Fingerprint

Dive into the research topics of 'Examining nanoscale photovoltaics with high brightness Fourier transform measurements'. Together they form a unique fingerprint.

Cite this