Experimental investigation of nanoscale thermal transport in hotspots at cryogenic temperatures

Hyuk Ju Ryu; Levente J. Klein; Mehdi Asheghi; Hendrik F. Hamann

doi:10.1109/ITHERM.2008.4544366

Experimental investigation of nanoscale thermal transport in hotspots at cryogenic temperatures

Hyuk Ju Ryu
, Levente J. Klein
, Mehdi Asheghi
, Hendrik F. Hamann

Office of the Dean SOMAS

University of Wisconsin-Madison
IBM
iCONA Technology
Stanford University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

A scaling study of "localized heating effect" or ballistic phonon transport at cryogenic temperature in crystalline silicon is reported using electrical Joule heating and thermometry of patterned platinum nanoheaters. The thermal resistances of nanoheaters with width ranging from 100 nm up to 5000 nm were measured. The experimental results were processed and analyzed using a very simple thermal resistance model, which must be eventually improved and perfected using simultaneous three-dimensional electrical and heat transfer numerical simulations. However, the preliminary results revealed several important trends indicating the prevalence of localized heating or sub-continuum transport phenomena in the vicinity of a hotspot at low temperatures.

Original language	English
Title of host publication	2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM
Pages	925-930
Number of pages	6
DOIs	https://doi.org/10.1109/ITHERM.2008.4544366
State	Published - 2008
Event	2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM - Orlando,FL, United States Duration: May 28 2008 → May 31 2008

Publication series

Name	2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM

Conference

Conference	2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM
Country/Territory	United States
City	Orlando,FL
Period	05/28/08 → 05/31/08

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10.1109/ITHERM.2008.4544366

Cite this

Ryu, H. J., Klein, L. J., Asheghi, M., & Hamann, H. F. (2008). Experimental investigation of nanoscale thermal transport in hotspots at cryogenic temperatures. In 2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM (pp. 925-930). Article 4544366 (2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM). https://doi.org/10.1109/ITHERM.2008.4544366

Ryu, Hyuk Ju ; Klein, Levente J. ; Asheghi, Mehdi et al. / Experimental investigation of nanoscale thermal transport in hotspots at cryogenic temperatures. 2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM. 2008. pp. 925-930 (2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM).

@inproceedings{2bcf9f3316204eb9a54430408c1e56d0,

title = "Experimental investigation of nanoscale thermal transport in hotspots at cryogenic temperatures",

abstract = "A scaling study of {"}localized heating effect{"} or ballistic phonon transport at cryogenic temperature in crystalline silicon is reported using electrical Joule heating and thermometry of patterned platinum nanoheaters. The thermal resistances of nanoheaters with width ranging from 100 nm up to 5000 nm were measured. The experimental results were processed and analyzed using a very simple thermal resistance model, which must be eventually improved and perfected using simultaneous three-dimensional electrical and heat transfer numerical simulations. However, the preliminary results revealed several important trends indicating the prevalence of localized heating or sub-continuum transport phenomena in the vicinity of a hotspot at low temperatures.",

author = "Ryu, \{Hyuk Ju\} and Klein, \{Levente J.\} and Mehdi Asheghi and Hamann, \{Hendrik F.\}",

year = "2008",

doi = "10.1109/ITHERM.2008.4544366",

language = "English",

isbn = "9781424417018",

series = "2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM",

pages = "925--930",

booktitle = "2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM",

note = "2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM ; Conference date: 28-05-2008 Through 31-05-2008",

}

Ryu, HJ, Klein, LJ, Asheghi, M & Hamann, HF 2008, Experimental investigation of nanoscale thermal transport in hotspots at cryogenic temperatures. in 2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM., 4544366, 2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM, pp. 925-930, 2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM, Orlando,FL, United States, 05/28/08. https://doi.org/10.1109/ITHERM.2008.4544366

Experimental investigation of nanoscale thermal transport in hotspots at cryogenic temperatures. / Ryu, Hyuk Ju; Klein, Levente J.; Asheghi, Mehdi et al.
2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM. 2008. p. 925-930 4544366 (2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Experimental investigation of nanoscale thermal transport in hotspots at cryogenic temperatures

AU - Ryu, Hyuk Ju

AU - Klein, Levente J.

AU - Asheghi, Mehdi

AU - Hamann, Hendrik F.

PY - 2008

Y1 - 2008

N2 - A scaling study of "localized heating effect" or ballistic phonon transport at cryogenic temperature in crystalline silicon is reported using electrical Joule heating and thermometry of patterned platinum nanoheaters. The thermal resistances of nanoheaters with width ranging from 100 nm up to 5000 nm were measured. The experimental results were processed and analyzed using a very simple thermal resistance model, which must be eventually improved and perfected using simultaneous three-dimensional electrical and heat transfer numerical simulations. However, the preliminary results revealed several important trends indicating the prevalence of localized heating or sub-continuum transport phenomena in the vicinity of a hotspot at low temperatures.

AB - A scaling study of "localized heating effect" or ballistic phonon transport at cryogenic temperature in crystalline silicon is reported using electrical Joule heating and thermometry of patterned platinum nanoheaters. The thermal resistances of nanoheaters with width ranging from 100 nm up to 5000 nm were measured. The experimental results were processed and analyzed using a very simple thermal resistance model, which must be eventually improved and perfected using simultaneous three-dimensional electrical and heat transfer numerical simulations. However, the preliminary results revealed several important trends indicating the prevalence of localized heating or sub-continuum transport phenomena in the vicinity of a hotspot at low temperatures.

UR - https://www.scopus.com/pages/publications/50949114406

U2 - 10.1109/ITHERM.2008.4544366

DO - 10.1109/ITHERM.2008.4544366

M3 - Conference contribution

AN - SCOPUS:50949114406

SN - 9781424417018

T3 - 2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM

SP - 925

EP - 930

BT - 2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM

T2 - 2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM

Y2 - 28 May 2008 through 31 May 2008

ER -

Ryu HJ, Klein LJ, Asheghi M, Hamann HF. Experimental investigation of nanoscale thermal transport in hotspots at cryogenic temperatures. In 2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM. 2008. p. 925-930. 4544366. (2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM). doi: 10.1109/ITHERM.2008.4544366

Experimental investigation of nanoscale thermal transport in hotspots at cryogenic temperatures

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