TY - GEN
T1 - Finding broad-scale patterns in large size electronic circuit netlists
AU - Yang, Zhao
AU - Doboli, Alex
PY - 2005
Y1 - 2005
N2 - Integrated circuit structure has advanced to extremely large complexity, such as 108 or more components per chip. Design and circuit optimization becomes quite difficult for these IC sizes. This paper presents a methodology that helps to understand the circuit topologies before the physical realization of the system. This paper explains that large size electronic circuit netlists have broad-scale patterns and large clustering coefficients. These attributes are very different from random graphs, usually assumed for representing circuit netlists. Furthermore, the paper introduces a model to explain the large clustering coefficient of electronic circuit netlists.
AB - Integrated circuit structure has advanced to extremely large complexity, such as 108 or more components per chip. Design and circuit optimization becomes quite difficult for these IC sizes. This paper presents a methodology that helps to understand the circuit topologies before the physical realization of the system. This paper explains that large size electronic circuit netlists have broad-scale patterns and large clustering coefficients. These attributes are very different from random graphs, usually assumed for representing circuit netlists. Furthermore, the paper introduces a model to explain the large clustering coefficient of electronic circuit netlists.
UR - https://www.scopus.com/pages/publications/33847096493
U2 - 10.1109/MWSCAS.2005.1594100
DO - 10.1109/MWSCAS.2005.1594100
M3 - Conference contribution
AN - SCOPUS:33847096493
SN - 0780391977
SN - 9780780391970
T3 - Midwest Symposium on Circuits and Systems
SP - 307
EP - 310
BT - 2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005
T2 - 2005 IEEE International 48th Midwest Symposium on Circuits and Systems, MWSCAS 2005
Y2 - 7 August 2005 through 10 August 2005
ER -