Fourier reconstruction of density profiles of thin films using anomalous x-ray reflectivity

M. K. Sanyal; S. K. Sinha; A. Gibaud; K. G. Huang; B. L. Carvalho; M. Rafailovich; J. Sokolov; X. Zhao; W. Zhao

doi:10.1209/0295-5075/21/6/010

Fourier reconstruction of density profiles of thin films using anomalous x-ray reflectivity

M. K. Sanyal
, S. K. Sinha
, A. Gibaud
, K. G. Huang
, B. L. Carvalho
, M. Rafailovich
, J. Sokolov
, X. Zhao
, W. Zhao

Materials Science and Engineering

Brookhaven National Laboratory
Homi Bhabha National Institute
ExxonMobil
Le Mans Université
Argonne National Laboratory
Massachusetts Institute of Technology
City University of New York

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

The use of X-ray and neutron reflectivity measurements to determine the density profile across and interface or across thin films has become increasingly popular over the last fewyears. However, in general convenient model-independent methods of inverting the reflectivityprofiles to obtain the density profile have been missing. We present here one such approach usingthe method of anomalous reflectivity from the substrate and demonstrate its applicability in thecase of an organic thin film.

Original language	English
Pages (from-to)	696
Number of pages	1
Journal	EPL
Volume	21
Issue number	6
DOIs	https://doi.org/10.1209/0295-5075/21/6/010
State	Published - Feb 20 1993

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abstract = "The use of X-ray and neutron reflectivity measurements to determine the density profile across and interface or across thin films has become increasingly popular over the last fewyears. However, in general convenient model-independent methods of inverting the reflectivityprofiles to obtain the density profile have been missing. We present here one such approach usingthe method of anomalous reflectivity from the substrate and demonstrate its applicability in thecase of an organic thin film.",

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AU - Sanyal, M. K.

AU - Sinha, S. K.

AU - Gibaud, A.

AU - Huang, K. G.

AU - Carvalho, B. L.

AU - Rafailovich, M.

AU - Sokolov, J.

AU - Zhao, X.

AU - Zhao, W.

PY - 1993/2/20

Y1 - 1993/2/20

N2 - The use of X-ray and neutron reflectivity measurements to determine the density profile across and interface or across thin films has become increasingly popular over the last fewyears. However, in general convenient model-independent methods of inverting the reflectivityprofiles to obtain the density profile have been missing. We present here one such approach usingthe method of anomalous reflectivity from the substrate and demonstrate its applicability in thecase of an organic thin film.

AB - The use of X-ray and neutron reflectivity measurements to determine the density profile across and interface or across thin films has become increasingly popular over the last fewyears. However, in general convenient model-independent methods of inverting the reflectivityprofiles to obtain the density profile have been missing. We present here one such approach usingthe method of anomalous reflectivity from the substrate and demonstrate its applicability in thecase of an organic thin film.

UR - https://www.scopus.com/pages/publications/84956097553

U2 - 10.1209/0295-5075/21/6/010

DO - 10.1209/0295-5075/21/6/010

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SN - 0295-5075

VL - 21

SP - 696

JO - EPL

JF - EPL

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ER -

Fourier reconstruction of density profiles of thin films using anomalous x-ray reflectivity

Abstract

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