Abstract
GaAs detectors can be fabricated with bidimensional single-sided electrode segmentation. They have been successfully bonded using flip-chip technology to the Omega-3 silicon read-out chip. We present here the design features of the GaAs pixel detectors and results from a test performed at the CERN SpS with a 120 GeV π- beam. The detection efficiency was 99.2% with a nominal threshold of 5000e-.
| Original language | English |
|---|---|
| Pages (from-to) | 6-11 |
| Number of pages | 6 |
| Journal | Nuclear Inst. and Methods in Physics Research, A |
| Volume | 410 |
| Issue number | 1 |
| DOIs | |
| State | Published - Jun 1 1998 |
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