Abstract
A method is described which elucidates propagation of an electromagnetic field generated by a stochastic, electromagnetic source within the short wavelength limit. The results can be used to determine statistical properties of fields using ray tracing methods.
| Original language | English |
|---|---|
| Article number | 043831 |
| Journal | Physical Review A - Atomic, Molecular, and Optical Physics |
| Volume | 77 |
| Issue number | 4 |
| DOIs | |
| State | Published - Apr 24 2008 |
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