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Ghost imaging to see internal structure of a biological object with X-ray-based speckle illumination

  • Sanjit Karmakar
  • , Justin Goodrich
  • , Andrei Fluerasu
  • , Kwangmin Yu
  • , Cinzia Da Vià
  • , Andrei Nomerotski
  • , Elisha Siddiqui Matekole
  • , Lonny Berman
  • , Timothy Paape
  • , Sean McSweeney
  • Stony Brook University
  • United States Department of Energy
  • Brookhaven National Laboratory

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We report an experimental demonstration of X-ray Ghost Imaging (GI) to observe the internal structure of a cardamom seed. To the best of our knowledge, this is the first use of GI to see the internal structure of biological samples. GI has been successfully demonstrated at visible and infrared wavelengths as a tool to perform precise imaging. At X-ray energies GI has a further potential to reach this goal with the additional advantage of reducing disruptive radiation doses to biological samples. The experiment was performed using 9.6 keV X-rays at the 11-ID Coherent Hard X-ray Scattering (CHX) beamline of the National Synchrotron Light Source II (NSLS-II) facility at Brookhaven National Laboratory (BNL). This imaging technique has application potential in non-destructive examination of sensitive materials in the industrial and commercial sectors.

Original languageEnglish
Title of host publicationAnomaly Detection and Imaging with X-Rays (ADIX) IX
EditorsAmit Ashok, Joel A. Greenberg, Michael E. Gehm
PublisherSPIE
ISBN (Electronic)9781510674042
DOIs
StatePublished - 2024
EventAnomaly Detection and Imaging with X-Rays (ADIX) IX 2024 - National Harbor, United States
Duration: Apr 24 2024Apr 25 2024

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13043
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceAnomaly Detection and Imaging with X-Rays (ADIX) IX 2024
Country/TerritoryUnited States
CityNational Harbor
Period04/24/2404/25/24

Keywords

  • Ghost imaging
  • non-destructive inspection
  • X-ray regime

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