Abstract
Zinc oxide crystals were grown using hydrothermal method, and the habit faces were indexed by computing from inter-axial angles of the as grown boules. The dislocation structures were studied using synchrotron white beam X-ray topography. Grown-in dislocations as well as process-induced defects were characterized in the ZnO crystals. Knoop and Vickers micro-hardness were studied on sliced crystal plates. Chemical etching was used to study the dislocations running perpendicular to the wafer.
| Original language | English |
|---|---|
| Pages (from-to) | 74-79 |
| Number of pages | 6 |
| Journal | Journal of Crystal Growth |
| Volume | 297 |
| Issue number | 1 |
| DOIs | |
| State | Published - Dec 15 2006 |
Keywords
- A1. Characterization
- A1. Crystal morphology
- A1. Defects
- A2. Growth from solutions
- A2. Hydrothermal crystal growth
- A2. Single crystal growth
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