Abstract
Bulk aluminum nitride boules have been grown at driving rates of 0.9mm/h by the self-seeded sublimation-recondensation technique. Up to 15mm diameter substrates cut from those boules present large single crystal grains that have been analyzed using different techniques. X-ray double crystal diffraction shows a full-width-at-half-maximum of around 100 arcsec and X-ray topography reveals extensive areas with a density of dislocations less than 104 cm-2. These substrates have been prepared by chemical mechanical polishing techniques to obtain a surface roughness of 1.4-1.6nm.
| Original language | English |
|---|---|
| Pages (from-to) | G1.10.1-G1.10.6 |
| Journal | Materials Research Society Symposium - Proceedings |
| Volume | 639 |
| State | Published - 2001 |
| Event | GaN and Related Alloys 2000 - Boston, MA, United States Duration: Nov 27 2000 → Dec 1 2000 |
Fingerprint
Dive into the research topics of 'Growth of self-seeded aluminum nitride by sublimation-recondensation and substrate preparation'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver