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High-resolution threshold photoionization of N2O

  • Purdue University
  • Brookhaven National Laboratory

Research output: Contribution to journalArticlepeer-review

58 Scopus citations

Abstract

Pulsed field ionization (PFI) has been used in conjunction with a coherent vuv source to obtain high-resolution threshold photoelectron spectra for the (000), (010), (020), and (100) vibrational states of the N2O + cation. Simulations for the rotational profiles of each vibronic level were obtained by fitting the Buckingham-Orr-Sichel equations [A. D. Buckingham, B. J. Orr, and J. M. Sichel, Philos. Trans. R. Soc. London, Ser. A 268, 147 (1970)] using accurate spectroscopic constants for the ground states of the neutral and the ion. The relative branch intensities are interpreted in terms of the partial waves of the outgoing photoelectron to which the ionic core is coupled and in terms of the angular momentum transferred to the core. The PFI technique also allows us to report an improved value for the ionization potential of N2O of 103 963 ± 5 cm-1.

Original languageEnglish
Pages (from-to)746-753
Number of pages8
JournalJournal of Chemical Physics
Volume95
Issue number2
DOIs
StatePublished - 1991

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