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In situ 3D imaging and characterization of nano-structures with x-ray nano-CT technique

  • United States Department of Energy
  • University of Connecticut

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

High-resolution x-ray microscopy and nano-CT provides a new approach to non-invasively and non-destructively study nano-structures in situ and in operando. Combined with tunable synchrotron x-ray sources, the elemental and certain chemical compositions can also be mapped dynamically in 3D. These capabilities are valuable for studying electrochemical systems, particularly those involving electrochemical reactions with porous structures at tens of nm to micron scale. The paper gives an introduction of this technique with several examples.

Original languageEnglish
Title of host publicationCharacterization of Porous Materials 3
Pages21-29
Number of pages9
Edition24
DOIs
StatePublished - 2011
EventCharacterization of Porous Materials 3 - 219th ECS Meeting - Montreal, QC, Canada
Duration: May 1 2011May 6 2011

Publication series

NameECS Transactions
Number24
Volume35
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Conference

ConferenceCharacterization of Porous Materials 3 - 219th ECS Meeting
Country/TerritoryCanada
CityMontreal, QC
Period05/1/1105/6/11

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