Abstract
GaInSb and AlGaInSb compositionally graded buffer layers grown on GaSb by MBE were used to develop unrelaxed InAs1-xSbx epitaxial alloys with strain-free native lattice constants up to 2.1% larger than that of GaSb. The in-plane lattice constant of the strained top buffer layer was grown to be equal to the native, unstrained lattice constant of InAs 1-xSbx with given x. The InAs0.56Sb 0.44 layers demonstrated a photoluminescence (PL) peak at 9.4 μm at T = 150 K. The minority carrier lifetime measured at 77 K for InAs 0.8Sb0.2 was 250 ns.
| Original language | English |
|---|---|
| Article number | 1250013 |
| Journal | International Journal of High Speed Electronics and Systems |
| Volume | 21 |
| Issue number | 1 |
| DOIs | |
| State | Published - Mar 2012 |
Keywords
- compositionally graded buffer
- InAsSb
- infrared
- MBE
- minority carrier lifetime
- reciprocal space mapping
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