Interface segregation in copolymer blends measured by neutron reflection and secondary ion mass spectrometry

T. Mansfield; R. S. Stein; R. J. Composto; M. H. Rafailovich; J. Sokolov; S. A. Schwarz

doi:10.1016/0921-4526(91)90050-O

Interface segregation in copolymer blends measured by neutron reflection and secondary ion mass spectrometry

T. Mansfield
, R. S. Stein
, R. J. Composto
, M. H. Rafailovich
, J. Sokolov
, S. A. Schwarz

Materials Science and Engineering

University of Massachusetts
Telcordia Technologies

Research output: Contribution to journal › Article › peer-review

13 Scopus citations

Abstract

In polymer blends of poly(styrene-co-acrylonitrile) (SAN) differing in acrylonitrile content, the SAN with the lower acrylonitrile component enriches the vacuum-polymer and polymer-substrate interfaces. The concentration profiles determined by neutron reflection measurements yield an interfacial excess of 80 and 38 Å near the surface and substrate, respectively. Using contrast matching, neutron reflection is shown to be quite sensitive to segregation near buried interfaces. Depths profiles measured by neutron reflection and secondary-ion mass spectrometry are in good qualitative agreement.

Original language	English
Pages (from-to)	207-210
Number of pages	4
Journal	Physica B: Condensed Matter
Volume	173
Issue number	1-2
DOIs	https://doi.org/10.1016/0921-4526(91)90050-O
State	Published - Aug 1991

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@article{e4a3e74999a64c1e94df8dcfff68b990,

title = "Interface segregation in copolymer blends measured by neutron reflection and secondary ion mass spectrometry",

abstract = "In polymer blends of poly(styrene-co-acrylonitrile) (SAN) differing in acrylonitrile content, the SAN with the lower acrylonitrile component enriches the vacuum-polymer and polymer-substrate interfaces. The concentration profiles determined by neutron reflection measurements yield an interfacial excess of 80 and 38 {\AA} near the surface and substrate, respectively. Using contrast matching, neutron reflection is shown to be quite sensitive to segregation near buried interfaces. Depths profiles measured by neutron reflection and secondary-ion mass spectrometry are in good qualitative agreement.",

author = "T. Mansfield and Stein, \{R. S.\} and Composto, \{R. J.\} and Rafailovich, \{M. H.\} and J. Sokolov and Schwarz, \{S. A.\}",

year = "1991",

month = aug,

doi = "10.1016/0921-4526(91)90050-O",

language = "English",

volume = "173",

pages = "207--210",

journal = "Physica B: Condensed Matter",

issn = "0921-4526",

number = "1-2",

}

TY - JOUR

T1 - Interface segregation in copolymer blends measured by neutron reflection and secondary ion mass spectrometry

AU - Mansfield, T.

AU - Stein, R. S.

AU - Composto, R. J.

AU - Rafailovich, M. H.

AU - Sokolov, J.

AU - Schwarz, S. A.

PY - 1991/8

Y1 - 1991/8

N2 - In polymer blends of poly(styrene-co-acrylonitrile) (SAN) differing in acrylonitrile content, the SAN with the lower acrylonitrile component enriches the vacuum-polymer and polymer-substrate interfaces. The concentration profiles determined by neutron reflection measurements yield an interfacial excess of 80 and 38 Å near the surface and substrate, respectively. Using contrast matching, neutron reflection is shown to be quite sensitive to segregation near buried interfaces. Depths profiles measured by neutron reflection and secondary-ion mass spectrometry are in good qualitative agreement.

AB - In polymer blends of poly(styrene-co-acrylonitrile) (SAN) differing in acrylonitrile content, the SAN with the lower acrylonitrile component enriches the vacuum-polymer and polymer-substrate interfaces. The concentration profiles determined by neutron reflection measurements yield an interfacial excess of 80 and 38 Å near the surface and substrate, respectively. Using contrast matching, neutron reflection is shown to be quite sensitive to segregation near buried interfaces. Depths profiles measured by neutron reflection and secondary-ion mass spectrometry are in good qualitative agreement.

UR - https://www.scopus.com/pages/publications/0026206263

U2 - 10.1016/0921-4526(91)90050-O

DO - 10.1016/0921-4526(91)90050-O

M3 - Article

AN - SCOPUS:0026206263

SN - 0921-4526

VL - 173

SP - 207

EP - 210

JO - Physica B: Condensed Matter

JF - Physica B: Condensed Matter

IS - 1-2

ER -

Interface segregation in copolymer blends measured by neutron reflection and secondary ion mass spectrometry

Abstract

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