Interfacial properties of soft matter thin films studied by X-ray reflectivity

O. H. Seeck; I. D. Kaendler; D. Shu; Hyunjung Kim; K. Shin; M. Rafailovich; J. Sokolov; M. Tolan; S. K. Sinha

Interfacial properties of soft matter thin films studied by X-ray reflectivity

O. H. Seeck
, I. D. Kaendler
, D. Shu
, Hyunjung Kim
, K. Shin
, M. Rafailovich
, J. Sokolov
, M. Tolan
, S. K. Sinha

Materials Science and Engineering

Argonne National Laboratory
Stony Brook University
Kiel University

Research output: Contribution to journal › Article › peer-review

Abstract

Thin film polymer bilayers and confined liquids have been investigated by x-ray specular reflectivity. First, it is shown that x-ray scattering on polymer bilayers can be superior to neutron scattering if special methods to analyze the data is applied, although neutrons are usually preferred. Second, confined liquids are addressed. The experimental setup for x-ray scattering is presented. Preliminary results are shown, which suggest quantized film thicknesses of the confined liquid.

Original language	English
Pages (from-to)	129-142
Number of pages	14
Journal	ACS Symposium Series
Volume	781
State	Published - 2001

Cite this

@article{b8fc416461f94f13bdffb9bd4a9ca0a1,

title = "Interfacial properties of soft matter thin films studied by X-ray reflectivity",

abstract = "Thin film polymer bilayers and confined liquids have been investigated by x-ray specular reflectivity. First, it is shown that x-ray scattering on polymer bilayers can be superior to neutron scattering if special methods to analyze the data is applied, although neutrons are usually preferred. Second, confined liquids are addressed. The experimental setup for x-ray scattering is presented. Preliminary results are shown, which suggest quantized film thicknesses of the confined liquid.",

author = "Seeck, \{O. H.\} and Kaendler, \{I. D.\} and D. Shu and Hyunjung Kim and K. Shin and M. Rafailovich and J. Sokolov and M. Tolan and Sinha, \{S. K.\}",

year = "2001",

language = "English",

volume = "781",

pages = "129--142",

journal = "ACS Symposium Series",

issn = "0097-6156",

}

TY - JOUR

T1 - Interfacial properties of soft matter thin films studied by X-ray reflectivity

AU - Seeck, O. H.

AU - Kaendler, I. D.

AU - Shu, D.

AU - Kim, Hyunjung

AU - Shin, K.

AU - Rafailovich, M.

AU - Sokolov, J.

AU - Tolan, M.

AU - Sinha, S. K.

PY - 2001

Y1 - 2001

N2 - Thin film polymer bilayers and confined liquids have been investigated by x-ray specular reflectivity. First, it is shown that x-ray scattering on polymer bilayers can be superior to neutron scattering if special methods to analyze the data is applied, although neutrons are usually preferred. Second, confined liquids are addressed. The experimental setup for x-ray scattering is presented. Preliminary results are shown, which suggest quantized film thicknesses of the confined liquid.

AB - Thin film polymer bilayers and confined liquids have been investigated by x-ray specular reflectivity. First, it is shown that x-ray scattering on polymer bilayers can be superior to neutron scattering if special methods to analyze the data is applied, although neutrons are usually preferred. Second, confined liquids are addressed. The experimental setup for x-ray scattering is presented. Preliminary results are shown, which suggest quantized film thicknesses of the confined liquid.

UR - https://www.scopus.com/pages/publications/0042905788

M3 - Article

AN - SCOPUS:0042905788

SN - 0097-6156

VL - 781

SP - 129

EP - 142

JO - ACS Symposium Series

JF - ACS Symposium Series

ER -

Interfacial properties of soft matter thin films studied by X-ray reflectivity

Abstract

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