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Inverse scattering for near-field scanning optical microscopy with broadband illumination

  • University of Illinois at Urbana-Champaign
  • University of Pennsylvania

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

The linear inverse problem for near-field optical microscopy is solved for a broadband scanning modality. Pseudo-inverse formulae are derived and illustrated with numerical simulations.

Original languageEnglish
Pages (from-to)809-815
Number of pages7
JournalJournal of Modern Optics
Volume57
Issue number9
DOIs
StatePublished - May 2010

Keywords

  • inverse problem
  • microscopy
  • near-field
  • scanning probe
  • spectral
  • tomography

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