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Measurement of latent tracks in amorphous SiO2 using small angle X-ray scattering

  • P. Kluth
  • , C. S. Schnohr
  • , D. J. Sprouster
  • , A. P. Byrne
  • , D. J. Cookson
  • , M. C. Ridgway
  • Australian National University
  • Australian Nuclear Science and Technology Organisation

Research output: Contribution to journalArticlepeer-review

44 Scopus citations

Abstract

In this paper we present preliminary yet promising results on the measurement of latent ion tracks in amorphous, 2 μm thick SiO2 layers using small angle X-ray scattering (SAXS). The tracks were generated by ion irradiation with 89 MeV Au ions to fluences between 3 × 1010 and 3 × 1012 ions/cm2. Transmission SAXS measurements show distinct scattering from the irradiated SiO2 as compared to the unirradiated material. Analysis of the SAXS spectra using a cylindrical model suggests a core-shell like density distribution in the ion tracks with a lower density core and a higher density shell as compared to unirradiated material. The total track radius of ∼48 Å is in very good agreement with previous experiments and calculations based on an inelastic thermal spike model.

Original languageEnglish
Pages (from-to)2994-2997
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume266
Issue number12-13
DOIs
StatePublished - Jun 2008

Keywords

  • Latent tracks
  • SAXS
  • SiO
  • Swift heavy ion irradiation

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