TY - GEN
T1 - Measurement of Multilayer Coating Thickness on Interwoven Carbon-Fiber-Reinforced Polymers by Sparse Deconvolution of THz Polarimetry Pulses
AU - Karimi, Arash
AU - Harris, Zachery B.
AU - Heller, Erica
AU - Arbab, M. Hassan
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - Terahertz time-domain spectroscopy (TDS) has shown promising applications in non-destructive thickness measurement of various industrial products. Despite significant advances, multilayered, optically thin, and anisotropic samples pose extra complications to the analysis of thickness measurements. Interwoven carbon-fiber reinforced polymers, which show polarimetric anisotropy and surface non-uniformity due to the weave structure of the carbon bundles, are among these complicated specimens. In this study, we use a dual-channel polarimetric THz-TDS scanner to address this problem for anisotropic structures. Use of the polarization information allows for mapping the thickness variation over the warp and weft of the samples. In addition, by utilizing the sparse deconvolution algorithm, we accurately predict the thickness of optically thin multilayer coating with an uncertainty (resolution) of ±12 μm and accuracy of 92%, which represents a significant improvement over the previously demonstrated performance metrics.
AB - Terahertz time-domain spectroscopy (TDS) has shown promising applications in non-destructive thickness measurement of various industrial products. Despite significant advances, multilayered, optically thin, and anisotropic samples pose extra complications to the analysis of thickness measurements. Interwoven carbon-fiber reinforced polymers, which show polarimetric anisotropy and surface non-uniformity due to the weave structure of the carbon bundles, are among these complicated specimens. In this study, we use a dual-channel polarimetric THz-TDS scanner to address this problem for anisotropic structures. Use of the polarization information allows for mapping the thickness variation over the warp and weft of the samples. In addition, by utilizing the sparse deconvolution algorithm, we accurately predict the thickness of optically thin multilayer coating with an uncertainty (resolution) of ±12 μm and accuracy of 92%, which represents a significant improvement over the previously demonstrated performance metrics.
UR - https://www.scopus.com/pages/publications/105032750482
U2 - 10.1109/IRMMW-THz61557.2025.11320032
DO - 10.1109/IRMMW-THz61557.2025.11320032
M3 - Conference contribution
AN - SCOPUS:105032750482
T3 - International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
BT - 50th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2025
PB - IEEE Computer Society
T2 - 50th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2025
Y2 - 17 August 2025 through 22 August 2025
ER -