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Measurement of semiconductor laser gain by the segmented contact method under strong current spreading conditions

  • Stony Brook University
  • Maxion Technologies, Inc.
  • U.S. Army Research Laboratory

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

A segmented contact method for the measurement of optical gain is developed for the case of strong current spreading. A simple model of current spreading in a ridge laser with a segmented contact is proposed and analyzed. We show that current spreading effects should be taken into account in lasers with low threshold current densities and high ldquoopeningrdquo voltages. When applied to interband cascade lasers, the method gives an internal optical loss of ∼10-17 cm-1 and a differential gain of ∼2.9 cm/A at 80 K, which agrees well with previously reported Hakki-Paoli data. The limitations of the technique are discussed.

Original languageEnglish
Pages (from-to)561-566
Number of pages6
JournalIEEE Journal of Quantum Electronics
Volume44
Issue number6
DOIs
StatePublished - 2008

Keywords

  • Interband cascade lasers (ICL)
  • Mid-infrared (IR) lasers
  • Optical gain

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