Measurement of the parameters of a linear CCD structure as a one-dimensional X-ray imaging detector

The basic parameters of linear charge-coupled devices (CCD) as one-dimensional X-ray imaging detectors are measured in the 5.4-19.6 keV photon energy range. Within this range, the sensitivity-wavelength dependence is obtained. At the maximum of this dependence, the threshold flux density of photons for such a device attains 3×10⁶ cm^-2 s^-1 for a storage time of ∼ 150 ms. This is equivalent to the incidence of single photons on a CCD cell with dimensions of 15 υm×15 υm during a storage time which varies from 120 μs-30 s. Within the photon energy range mentioned above, the sensitivity varies from 0.3 to 3 mV·photon^-1·cell. The linearity of the dependence of signal amplitude on flux density of photons remains up to 7 × 10⁸ cm^-2 s^-1 Any dependence of the sensitivity on the flux density of photons is not revealed. The spatial resolution is better than 100 μm and must be measured with micron accuracies. In addition to the photosensitive region, the shift register one is successfully tried. The ways of improving the CCD parameters for registration of X-rays are discussed.