Measurement of the secondary emission yield of a thin diamond window in transmission mode

Chang Xiangyun; Ilan Ben-Zvi; Andrew Burrill; Steven Hulbert; Peter Johnson; Jorg Kewisch; Triveni Rao; John Smedley; Zvi Segalov; Zhao Yongxiang

doi:10.1109/PAC.2005.1591073

Measurement of the secondary emission yield of a thin diamond window in transmission mode

Chang Xiangyun
, Ilan Ben-Zvi
, Andrew Burrill
, Steven Hulbert
, Peter Johnson
, Jorg Kewisch
, Triveni Rao
, John Smedley
, Zvi Segalov
, Zhao Yongxiang

Physics and Astronomy

Brookhaven National Laboratory

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

7 Scopus citations

Abstract

The secondary emission enhanced photoinjector (SEEP) is a promising new approach to the generation of high-current, high-brightness electron beams. A low current primary electron beam with energy of a few thousand electron-volts strikes a specially prepared diamond window which emits secondary electrons with a current two orders of magnitude higher. The secondary electrons are created at the back side of the diamond and drift through the window under the influence of a strong electrical field. A hydrogen termination at the exit surface of the window creates a negative electron affinity (NEA) which allows the electrons to leave the diamond. An experiment was performed to measure the secondary electron yield and other properties. The results are discussed in this paper..

Original language	English
Title of host publication	Proceedings of the Particle Accelerator Conference, PAC 2005
Pages	2251-2253
Number of pages	3
DOIs	https://doi.org/10.1109/PAC.2005.1591073
State	Published - 2005
Event	Particle Accelerator Conference, PAC 2005 - Knoxville, TN, United States Duration: May 16 2005 → May 20 2005

Publication series

Name	Proceedings of the IEEE Particle Accelerator Conference
Volume	2005

Conference

Conference	Particle Accelerator Conference, PAC 2005
Country/Territory	United States
City	Knoxville, TN
Period	05/16/05 → 05/20/05

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10.1109/PAC.2005.1591073

Cite this

Xiangyun, C., Ben-Zvi, I., Burrill, A., Hulbert, S., Johnson, P., Kewisch, J., Rao, T., Smedley, J., Segalov, Z., & Yongxiang, Z. (2005). Measurement of the secondary emission yield of a thin diamond window in transmission mode. In Proceedings of the Particle Accelerator Conference, PAC 2005 (pp. 2251-2253). Article 1591073 (Proceedings of the IEEE Particle Accelerator Conference; Vol. 2005). https://doi.org/10.1109/PAC.2005.1591073

@inproceedings{af99eee949e84afaa429021ff3b9912c,

title = "Measurement of the secondary emission yield of a thin diamond window in transmission mode",

abstract = "The secondary emission enhanced photoinjector (SEEP) is a promising new approach to the generation of high-current, high-brightness electron beams. A low current primary electron beam with energy of a few thousand electron-volts strikes a specially prepared diamond window which emits secondary electrons with a current two orders of magnitude higher. The secondary electrons are created at the back side of the diamond and drift through the window under the influence of a strong electrical field. A hydrogen termination at the exit surface of the window creates a negative electron affinity (NEA) which allows the electrons to leave the diamond. An experiment was performed to measure the secondary electron yield and other properties. The results are discussed in this paper..",

author = "Chang Xiangyun and Ilan Ben-Zvi and Andrew Burrill and Steven Hulbert and Peter Johnson and Jorg Kewisch and Triveni Rao and John Smedley and Zvi Segalov and Zhao Yongxiang",

year = "2005",

doi = "10.1109/PAC.2005.1591073",

language = "English",

isbn = "0780388593",

series = "Proceedings of the IEEE Particle Accelerator Conference",

pages = "2251--2253",

booktitle = "Proceedings of the Particle Accelerator Conference, PAC 2005",

note = "Particle Accelerator Conference, PAC 2005 ; Conference date: 16-05-2005 Through 20-05-2005",

}

Xiangyun, C, Ben-Zvi, I, Burrill, A, Hulbert, S, Johnson, P, Kewisch, J, Rao, T, Smedley, J, Segalov, Z & Yongxiang, Z 2005, Measurement of the secondary emission yield of a thin diamond window in transmission mode. in Proceedings of the Particle Accelerator Conference, PAC 2005., 1591073, Proceedings of the IEEE Particle Accelerator Conference, vol. 2005, pp. 2251-2253, Particle Accelerator Conference, PAC 2005, Knoxville, TN, United States, 05/16/05. https://doi.org/10.1109/PAC.2005.1591073

Measurement of the secondary emission yield of a thin diamond window in transmission mode. / Xiangyun, Chang; Ben-Zvi, Ilan; Burrill, Andrew et al.
Proceedings of the Particle Accelerator Conference, PAC 2005. 2005. p. 2251-2253 1591073 (Proceedings of the IEEE Particle Accelerator Conference; Vol. 2005).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Measurement of the secondary emission yield of a thin diamond window in transmission mode

AU - Xiangyun, Chang

AU - Ben-Zvi, Ilan

AU - Burrill, Andrew

AU - Hulbert, Steven

AU - Johnson, Peter

AU - Kewisch, Jorg

AU - Rao, Triveni

AU - Smedley, John

AU - Segalov, Zvi

AU - Yongxiang, Zhao

PY - 2005

Y1 - 2005

N2 - The secondary emission enhanced photoinjector (SEEP) is a promising new approach to the generation of high-current, high-brightness electron beams. A low current primary electron beam with energy of a few thousand electron-volts strikes a specially prepared diamond window which emits secondary electrons with a current two orders of magnitude higher. The secondary electrons are created at the back side of the diamond and drift through the window under the influence of a strong electrical field. A hydrogen termination at the exit surface of the window creates a negative electron affinity (NEA) which allows the electrons to leave the diamond. An experiment was performed to measure the secondary electron yield and other properties. The results are discussed in this paper..

AB - The secondary emission enhanced photoinjector (SEEP) is a promising new approach to the generation of high-current, high-brightness electron beams. A low current primary electron beam with energy of a few thousand electron-volts strikes a specially prepared diamond window which emits secondary electrons with a current two orders of magnitude higher. The secondary electrons are created at the back side of the diamond and drift through the window under the influence of a strong electrical field. A hydrogen termination at the exit surface of the window creates a negative electron affinity (NEA) which allows the electrons to leave the diamond. An experiment was performed to measure the secondary electron yield and other properties. The results are discussed in this paper..

UR - https://www.scopus.com/pages/publications/33847173397

U2 - 10.1109/PAC.2005.1591073

DO - 10.1109/PAC.2005.1591073

M3 - Conference contribution

AN - SCOPUS:33847173397

SN - 0780388593

SN - 9780780388598

T3 - Proceedings of the IEEE Particle Accelerator Conference

SP - 2251

EP - 2253

BT - Proceedings of the Particle Accelerator Conference, PAC 2005

T2 - Particle Accelerator Conference, PAC 2005

Y2 - 16 May 2005 through 20 May 2005

ER -

Measurement of the secondary emission yield of a thin diamond window in transmission mode

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